• DocumentCode
    2684732
  • Title

    Dielectric Properties of Millimeter Wave Materials

  • Author

    Afsar, M.N. ; Button, K.J.

  • fYear
    1984
  • fDate
    May 30 1984-June 1 1984
  • Firstpage
    522
  • Lastpage
    524
  • Abstract
    It is no longer necessary to use extrapolated microwave dielectric values when designing millimeter wave components, devices and systems. We are now furnishing highly accurate millimeter wave (5 mm to 1/2 mm) data on complex dielectric permittivity and loss tangent to engineers for a variety of materials such as common ceramics, semiconductors, crystalline and glass materials. For most materials the dielectric loss increases with frequency in the millimeter, unlike the microwave, is an important feature of our new data. Reliable measurements also reveal that the method of Preparation of nominally identical specimens can change the dielectric losses by many factors.
  • Keywords
    Crystalline materials; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric materials; Microwave devices; Millimeter wave devices; Millimeter wave technology; Permittivity; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1984 IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1984.1131848
  • Filename
    1131848