DocumentCode
2684732
Title
Dielectric Properties of Millimeter Wave Materials
Author
Afsar, M.N. ; Button, K.J.
fYear
1984
fDate
May 30 1984-June 1 1984
Firstpage
522
Lastpage
524
Abstract
It is no longer necessary to use extrapolated microwave dielectric values when designing millimeter wave components, devices and systems. We are now furnishing highly accurate millimeter wave (5 mm to 1/2 mm) data on complex dielectric permittivity and loss tangent to engineers for a variety of materials such as common ceramics, semiconductors, crystalline and glass materials. For most materials the dielectric loss increases with frequency in the millimeter, unlike the microwave, is an important feature of our new data. Reliable measurements also reveal that the method of Preparation of nominally identical specimens can change the dielectric losses by many factors.
Keywords
Crystalline materials; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric materials; Microwave devices; Millimeter wave devices; Millimeter wave technology; Permittivity; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1984.1131848
Filename
1131848
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