Title :
Pulsed thermal characterization of a reverse biased pn-junction for ESD HBM simulation
Author :
Wolf, H. ; Gieser, H. ; Wilkening, W.
Author_Institution :
Technische Universitat Munchen
Keywords :
Avalanche breakdown; Calibration; Circuit simulation; Computational modeling; Diodes; Electric variables measurement; Electrostatic discharge; Pulse measurements; Temperature dependence; Voltage;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888198
