Title :
ESD protection to overcome internal gate oxide damage on digital-analog interface of mixed-mode CMOS IC´s
Author :
Ker, Ming-Dou ; Yu, Ta-Lee
Author_Institution :
Industrial Technology Research Institute
Keywords :
Analog integrated circuits; CMOS technology; Digital integrated circuits; Digital-analog conversion; Electrostatic discharge; Internal stresses; Pins; Protection; Variable structure systems; Voltage;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888202
