DocumentCode
2684864
Title
ESD protection to overcome internal gate oxide damage on digital-analog interface of mixed-mode CMOS IC´s
Author
Ker, Ming-Dou ; Yu, Ta-Lee
Author_Institution
Industrial Technology Research Institute
fYear
1996
fDate
1996
Firstpage
1727
Lastpage
1730
Keywords
Analog integrated circuits; CMOS technology; Digital integrated circuits; Digital-analog conversion; Electrostatic discharge; Internal stresses; Pins; Protection; Variable structure systems; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888202
Filename
888202
Link To Document