Title :
Risetime effects of HBM and square pulses on the failure thresholds of GGNMOS transistors
Author :
Musshoff, C. ; Wolf, H. ; Giesew, H. ; Eggew, P. ; Guggenmos, X.
Author_Institution :
Technical University of Munich
Keywords :
Biological system modeling; Capacitance; Circuit testing; Electrostatic discharge; Fingers; Humans; Integrated circuit modeling; Integrated circuit testing; Stress; Threshold voltage;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888206
