DocumentCode
2685003
Title
Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors
Author
Wouters, D.J. ; Maes, H.E.
Author_Institution
IMEC
fYear
1996
fDate
1996
Firstpage
1763
Lastpage
1766
Keywords
Capacitors; Degradation; Electrodes; Fatigue; Ferroelectric films; Ferroelectric materials; Hysteresis; Nonvolatile memory; Polarization; Read-write memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888211
Filename
888211
Link To Document