DocumentCode

2685151

Title

Improved critical area prediction by application of pattern recognition techniques

Author

Mattick, J.H.N. ; Kelsall, R.W. ; Miles, R.E.

Author_Institution

University of Leeds

fYear

1996

fDate

1996

Firstpage

1815

Lastpage

1818

Keywords

Atmospheric modeling; Circuit testing; Equations; Metallization; Pattern analysis; Pattern recognition; Predictive models; Robustness; Shape; Topology;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on

Print_ISBN

0-7803-3369-1

Type

conf

DOI

10.1109/ESREF.1996.888222

Filename

888222