DocumentCode :
2685161
Title :
The influence of process variations on the robustness of an audio power IC
Author :
Krabbenborg, Benno ; Van der Pol, Jakko
Author_Institution :
Philips Semiconductors, Consumer IC Nijmegen
fYear :
1996
fDate :
1996
Firstpage :
1819
Lastpage :
1822
Keywords :
Area measurement; Batteries; Doping; Electrical resistance measurement; Power integrated circuits; Power transistors; Pulse measurements; Robustness; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888223
Filename :
888223
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2685161
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