DocumentCode
2685170
Title
Method for precise determination of the statistical distribution of the input offset voltage of differential stages
Author
Thewes, R. ; Schindhelm, T. ; Tiebout, M. ; Wohlrab, E. ; Kollmer, U. ; Kessel, S. ; Schmitt-Landsiedel, Doris ; Weber, W.
Author_Institution
Siemens Corporate R&D
fYear
1996
fDate
1996
Firstpage
1823
Lastpage
1826
Keywords
Analog circuits; Circuit testing; Coupling circuits; Design optimization; Differential amplifiers; Operational amplifiers; Research and development; Statistical distributions; Tellurium; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888224
Filename
888224
Link To Document