DocumentCode
2685213
Title
Simulation of intense microwave pulse propagation in air breakdown environment
Author
Zhang, Yu Shrike ; Kuo, Spencer P.
fYear
1990
fDate
21-23 May 1990
Firstpage
172
Abstract
Summary form only given. When a high-power microwave pulse propagates in air with a breakdown threshold below the wave field of the pulse, the ionization of the air will occur. The electrons produced will attenuate the field amplitude at the tail portion of the pulse. If the electron density reaches the cutoff density of the microwave pulse, the reflection caused by cutoff will even cause severe tail erosion. An experiment was conducted to examine the phenomena. In the experiment, a 1-MW microwave pulse (1.1 μs) was propagated through a large Plexiglas chamber filled with dry air at low pressure at one side of the chamber, and was received and monitored at the other side. Two different degrees of tail erosion caused by two different mechanisms were identified experimentally. A computer simulation of the experiment was then carried out. Two coupled partial differential equations (PDEs) were used to describe the intense microwave pulse propagating in the air breakdown environment. A software package developed to solve PDEs was used to solve the equations with boundary conditions satisfying the experimental situation. Calculations of the pulse intensity and electron density as a function of space and time were compared with data, with good agreement
Keywords
air; electric breakdown of gases; plasma production; plasma simulation; 1 MW; Plexiglas chamber; air breakdown environment; boundary conditions; breakdown threshold; computer simulation; coupled partial differential equations; cutoff density; dry air; electron density; field amplitude attenuation; high-power; intense microwave pulse propagation; ionization; reflection; simulation; software package; tail erosion; wave field;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1990. IEEE Conference Record - Abstracts., 1990 IEEE International Conference on
Conference_Location
Oakland, CA, USA
Type
conf
DOI
10.1109/PLASMA.1990.110744
Filename
5726014
Link To Document