DocumentCode
2685309
Title
High Resolution Range Profile Recognition Using Robust Kernel Neighborhood Preserving Projection
Author
Zhou, Yun ; Yu, Xuelian ; Cui, Minglei ; Wang, Xuegang ; Li, ZhongZhi
Author_Institution
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2012
fDate
27-29 Oct. 2012
Firstpage
809
Lastpage
813
Abstract
A new manifold learning algorithm, called robust kernel neighborhood preserving projection (RKNPP), is presented and applied to radar target recognition based on high resolution range profiles. RKNPP attempts to map the high-dimensional data into such a low-dimensional space where points belonging to the same class are close to each other while points belonging to different classes are far away from each other, while preserving the main geometric structure of the original data. A sophisticated distance metric is utilized to construct the neighborhood graph of the input data, which has several good properties that are helpful to limit the effect of noise, and thus make RKNPP a robust classification method for real-world data. Moreover, in RKNPP, a simple technique of eigenvalue decomposition is applied to deal with the small sample size problem, to which not much attention has been paid in many manifold learning algorithms. Experimental results on measured data demonstrate the promising performance of the proposed method.
Keywords
eigenvalues and eigenfunctions; image classification; radar imaging; radar resolution; radar target recognition; classification method; distance metric; eigenvalue decomposition; high resolution range profile recognition; high-dimensional data mapping; manifold learning algorithm; radar target recognition; robust kernel neighborhood preserving projection; Kernel; Manifolds; Measurement; Noise; Radar; Robustness; Target recognition; manifold learning; neighborhood preserving projection; radar target recognition; small sample size problem;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Information Technology (CIT), 2012 IEEE 12th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4673-4873-7
Type
conf
DOI
10.1109/CIT.2012.165
Filename
6392004
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