Author :
Allenspach, M. ; Brews, J.R. ; Galloway, K.F. ; Johnson, G.H. ; Schrimpf, R.D. ; Pease, R.L. ; Titus, J.L. ; Wheatley, C.F.
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on