• DocumentCode
    2685407
  • Title

    Infrared spectroscopy in failure analysis

  • Author

    Malmberg, Hans

  • Author_Institution
    Chem. Anal., Life Time Eng. AB, Karlskoga, Sweden
  • fYear
    2011
  • fDate
    12-15 June 2011
  • Firstpage
    1021
  • Lastpage
    1025
  • Abstract
    Functional failures may be related to chemical and/or physical changes in the bulk of a component or at the interface between components. Failure due to contamination also may occur. A vital part of failure analysis is to use analytical techniques to elucidate the reason for failure. Infrared spectroscopy (FTIR) - a technique commonly used for identification of organic/polymeric materials - can be useful for this purpose. The capability of the technique will be exemplified and some cases will be shown in more detail.
  • Keywords
    Fourier transform spectra; contamination; failure analysis; infrared spectra; organic compounds; contamination; failure analysis; functional failures; infrared spectroscopy; organic material identification; polymeric material identification; Contacts; Copper; Explosives; Magnesium; Materials; Sea surface; Surface treatment; FTIR; analysis; failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
  • Conference_Location
    Guiyang
  • Print_ISBN
    978-1-61284-667-5
  • Type

    conf

  • DOI
    10.1109/ICRMS.2011.5979416
  • Filename
    5979416
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2685407