DocumentCode
2685456
Title
Analysis of the surface base current drift in GaAs HBT´s
Author
Maneux, C. ; Labat, N. ; Saysset, N. ; Toubul, A. ; Danto, Y. ; Dangla, J. ; Launay, P. ; Dumas, J.-M.
Author_Institution
ENSIL, University of LIMOGES
fYear
1996
fDate
1996
Firstpage
1903
Lastpage
1906
Keywords
Acceleration; Aging; Contact resistance; Degradation; Failure analysis; Gallium arsenide; Heterojunction bipolar transistors; Ohmic contacts; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888242
Filename
888242
Link To Document