DocumentCode :
2685476
Title :
Pulsed stress reliability investigations of schottky diodes and HBTS
Author :
Schubler, M. ; Krozew, V. ; Bock, K.H. ; Brandt, M. ; Vecc, L. ; Losi, R. ; Hartnagel, H.L.
Author_Institution :
Inst. fur Hochfrequenztechnik
fYear :
1996
fDate :
1996
Firstpage :
1907
Lastpage :
1910
Keywords :
Biological system modeling; Current density; Electrostatic discharge; Heterojunction bipolar transistors; Optical pulses; Performance evaluation; Schottky diodes; Stress; Testing; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888243
Filename :
888243
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2685476
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