Title :
Reliability and degradation behaviors of semi-insulating fe-doped InP buried hetero structure lasers fabricated by MOVPE and dry etching technique
Author :
Mawatari, Hiroyasu ; Fukuda, Mitsuo ; Matsumoto, Shin-ichi ; Kishi, Kotaro ; Itaya, Yoshio
Author_Institution :
NTT Opto-electronics Laboratories
Keywords :
Aging; Chemical lasers; Degradation; Epitaxial growth; Epitaxial layers; Etching; Indium phosphide; Laser stability; Laser theory; Quantum well lasers;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888245
