• DocumentCode
    2685568
  • Title

    A luminance inspector used for in-line backlight module quality assurance

  • Author

    Lin, Wu-Ja ; Ho, Chih-Wei ; Chiang, Donyau

  • Author_Institution
    Dept. of Comput. Sci. & Inform. Eng., Nat. Formosa Univ., Yunlin County, Taiwan
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    308
  • Lastpage
    312
  • Abstract
    In this paper, we propose a luminance inspector which uses a CCD camera and neural network models to inspect multiple backlight modules at once. The proposed inspector can display the results at predetermined checked points in real time which is important for in-line quality check. The proposed inspector is more efficient compared to the traditional inspector which examines checked points one by one. Experiments show that the proposed inspector yields satisfactory results.
  • Keywords
    CCD image sensors; electrical engineering computing; inspection; neural nets; quality assurance; CCD camera; inline backlight module quality assurance; luminance inspector; neural network models; Brightness; Cathode ray tubes; Charge coupled devices; Computer displays; Instruments; Light emitting diodes; Light sources; Liquid crystal displays; Neural networks; Quality assurance; back light module; inspector; luminance; small form factor device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488000
  • Filename
    5488000