• DocumentCode
    2685591
  • Title

    On Unified Delay Fault Testing

  • Author

    Pramanick, Ankan K. ; Reddy, Sudhakar M.

  • Author_Institution
    IBM Corporation
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    265
  • Lastpage
    268
  • Keywords
    Circuit faults; Circuit testing; Delay effects; Delay estimation; Electrical fault detection; Fault detection; Hardware; Logic testing; Robustness; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669694
  • Filename
    669694
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2685591