DocumentCode :
2685618
Title :
Failure ontology of board-level electronic product for reliability design
Author :
Zhou, Xuan ; Ren, Yi
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2011
fDate :
12-15 June 2011
Firstpage :
1086
Lastpage :
1091
Abstract :
This paper aims at sharing and reusing the reliability design knowledge of board-level electronic product (BLEP). The related concepts need to be compressed consistently in order to provide a common understanding of the reliability design knowledge, and a common recognition of the concept should be identified. Then based on this, all kinds of reliability design knowledge will be represented. In this paper, begin with the representation requirement of reliability design knowledge, the solution to expresses product reliability design knowledge with failure ontology and the related ontology will be given. Failure is considered as the key concept of the solution, according that we use ontology to describe the related concepts and the relations between the concepts of reliability design for BLEP, and the failure ontology structure of BLEP for reliability design. In the paper, the hypostasis of the BLEP failures are analyzed firstly, then the failure features and process are described with ontology, and the hierarchical failure ontology framework is constructed to form a common understanding. Secondly, according to the structure of failure ontology, the applications and the related terms of the failure ontology for BLEP are determined, the BLEP failure ontology model is established using skeletal methodology, and the method, based on the failure ontology, is provided to express the reliability design knowledge of BLEP. Finally, a typical BLEP is taken as the case to verify the feasibility of the method.
Keywords :
reliability; board-level electronic product; hierarchical failure ontology framework; reliability design knowledge; skeletal methodology; Encapsulation; Failure analysis; Ontologies; Reliability engineering; Soldering; Stress; BLEP (board-level electronic product); Failure; ontology; reliability design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
Type :
conf
DOI :
10.1109/ICRMS.2011.5979430
Filename :
5979430
Link To Document :
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