A new method of deciding the sample number of reliability growth tests for success-failure products

Author

Wang, Xingbo ; Li, Dexin ; Li, Bo ; Lin, Lin

Author_Institution

Dept. of Airborne Vehicle Eng., Naval Aeronaut. & Astronaut. Univ., Yantai, China

fYear

2011

fDate

12-15 June 2011

Firstpage

1034

Lastpage

1039

Abstract

New method of deciding the sample number of reliability growth tests for success-failure products was researched. The mathematical model was established with maximal success number of left products after tests as object function. The initially minimized maximum rule with sample estimation feedback to fix sample numbers of reliability growth tests was deduced. At last, an example was shown to illustrate this method. With comparing the results of adopting different parameters, it is indicated that the rule is robust and practical.

Keywords

Poisson distribution; binomial distribution; reliability; initially minimized maximum rule; reliability growth test; sample estimation feedback; success-failure product; Equations; Mathematical model; Maximum likelihood estimation; Reliability engineering; Stochastic processes; circular correction with sample estimate feedback; initially-minimized maximum rule; reliability growth test; success-failure products; systemic defaults;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on

Conference_Location

Guiyang

Print_ISBN

978-1-61284-667-5

Type

conf

DOI

10.1109/ICRMS.2011.5979436

Filename

5979436