• DocumentCode
    2685712
  • Title

    Ultrasonic features in wire bonding and thermosonic flip chip

  • Author

    Junhui Li ; Lei Han ; Jue Zhong

  • Author_Institution
    Sch. of Mech. & Electron. Eng., Central South Univ., Changsha
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Driving voltage and current signals of piezoceramic transducer (PZT) were measured directly by designing circuits from ultrasonic generator and using a data acquisition software system. Input impedance and power of PZT were investigated by using Root mean square (RMS) calculation. Vibration driven by high frequency was tested by laser Doppler vibrometer (PSV-400-M2). Thermosonic bonding features were observed by scanning electron microscope (JSM-6360LV). Results show that the input power of bonding is lower than that of no load. The input impedance of bonding is greater than that of no load. Nonlinear phase, plastic flow and expansion period, and strengthening process were shown in impedance and power curves. The ultrasonic power is proportion to vibration displacement driven by the power, and greater displacements driven by high-power result in welding failure phenomena, such as crack, break, and peel off in wedge bonding,. For thermosonic flip chip bonding, the high power decreases position precision of bonding or results in slippage and rotation phenomena of bumps. To improve reliability and precision of thermosonic bonding, the low ultrasonic power should be chosen.
  • Keywords
    data acquisition; flip-chip devices; lead bonding; piezoceramics; piezoelectric transducers; scanning electron microscopes; ultrasonic transducers; JSM-6360LV; PSV-400-M2; data acquisition software system; laser Doppler vibrometer; piezoceramic transducer; root mean square calculation; scanning electron microscope; thermosonic flip chip; ultrasonic features; ultrasonic generator; ultrasonic power; vibration displacement; wire bonding; Bonding; Current measurement; Flip chip; Impedance; Piezoelectric materials; Semiconductor device measurement; Software measurement; Ultrasonic transducers; Voltage; Wire; failure; input impedance and power; thermosonic flip chip; wedge bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4606954
  • Filename
    4606954