Title :
A multi-stress Accelerated Life Tests method for Smart Electricity Meter based upon the Life-Stress Model
Author :
Qi, Bangyan ; Sun, Yufeng ; Hu, Weiwei ; Ding, Xiaoxue
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
Current Accelerated Life Tests (ALT) mainly focuses on the single stress type of models. This article has delivered a type of ALT model named as the "Life-Stress Model", which is based upon the Weibull distribution and Peck\´s Temperature-Humidity Model. Also an actual ALT test on the DDZY33C-Z Smart Electricity Meter is performed to make a precise estimation of the Time Till Failure or TTF of the meter. This method has been proved to be efficient for the reason that it takes much less time and samples to make a life evaluation than other life testing methods. And it has guaranteed the result of the samples\´ life since a confidence level of 50% is given.
Keywords :
Weibull distribution; humidity; life testing; power meters; ALT model; Weibull distribution; life-stress model; multistress accelerated life tests method; smart electricity meter; temperature-humidity model; Electricity; Equations; Humidity; Life estimation; Mathematical model; Stress; Weibull distribution; ALT; Peck Model; Smar Meter; Weibull Distribution;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
DOI :
10.1109/ICRMS.2011.5979441
