DocumentCode :
2685828
Title :
A collisional model for plasma immersion ion implantation
Author :
Vahedi, V. ; Lieberman, M.A. ; Alves, M.V. ; Verboncoeur, John P. ; Birdsall, C.K.
fYear :
1990
fDate :
21-23 May 1990
Firstpage :
185
Abstract :
Summary form only given, as follows. In plasma immersion ion implantation, a target is immersed in a plasma and a series of negative short pulses is applied to it to implant the ions. A new analytical model is being developed for the high-pressure regimes in which the motion of the ions is highly collisional. The model provides values for ion flux, average ion velocity at the target, and sheath edge motion as a function of time. The model suggests that the transient ion flux at the target scales with Jc=√2eu0 n0 (1+ω0t)-5/7 , where ω0 and u0 are the characteristic frequency and velocity of the ions in the sheath, n 0 is the density, and t is the time. These values were compared with those obtained from simulation and show good agreement. A review was also carried out (for comparison) of earlier work done at low pressures, where the motion of ions in the sheath is collisionless, also showing good agreement between analysis and simulation. The simulation code is PDP1, which utilizes particle-in-cell techniques and Monte Carlo simulation of electron-neutral and ion-neutral collisions
Keywords :
ion implantation; plasma applications; plasma collision processes; plasma sheaths; Monte Carlo simulation; PDP1; analytical model; average ion velocity; characteristic frequency; collisional model; electron+neutral collisions; high-pressure regimes; highly collisional ion motion; ion flux; ion+neutral collision; negative short pulses; particle-in-cell techniques; plasma immersion ion implantation; sheath edge motion; simulation code; target;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1990. IEEE Conference Record - Abstracts., 1990 IEEE International Conference on
Conference_Location :
Oakland, CA, USA
Type :
conf
DOI :
10.1109/PLASMA.1990.110778
Filename :
5726048
Link To Document :
بازگشت