DocumentCode :
2685948
Title :
The application of a dual-substrate technique on a 10-Gb/s CMOS phase detector design
Author :
Kwasniewski, T.
Volume :
2
fYear :
2003
fDate :
21-24 Oct. 2003
Firstpage :
719
Abstract :
This paper presents a new dual-substrate technique used to overcome the small rail-to-rail supply voltage headroom available for short channel length CMOS technology. The technique is applied on a full-rate CMOS phase detector (PD) for synchronous optical network (SONET) OC-192 systems. A sample-and-hold PD for 10-Gb/s non return zero (NRZ) data implemented in a standard 0.18 μm CMOS technology is presented. The measurement results show that a linear range with no dead zone on phase error from -π/2 to π/2 is achieved. The core circuit dissipates a total power of 14.9mW from a +/- 1.6 V supply.
Keywords :
CMOS integrated circuits; phase detectors; sample and hold circuits; substrates; 0.18 microns; 1.6 V; 10 Gbits; 14.9 mW; CMOS phase detector; NRZ data; OC-192 systems; SONET; dead zone; dual-substrate; non return zero; phase error; rail-to-rail supply voltage headroom; sample-and-hold; short channel length CMOS technology; synchronous optical network; voltage supply;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
ISSN :
1523-553X
Print_ISBN :
0-7803-7889-X
Type :
conf
DOI :
10.1109/ICASIC.2003.1277311
Filename :
1277311
Link To Document :
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