Title : 
Common-mode noise reduction on broadside-coupled delay line
         
        
            Author : 
Ding-Bing Lin ; Chung-Pin Huang ; Hsin-Nan Ke ; Wen-Sheng Liu
         
        
            Author_Institution : 
Dept. of Electron. Eng., Taipei Tech (Nat. Taipei Univ. of Technol.), Taipei, Taiwan
         
        
        
        
        
        
            Abstract : 
Conventional edge-coupled differential delay lines are becoming popular choice on high-speed connection, which depend on their balanced property and superior immunity to noise interference. Although edge-coupled differential delay lines with differential signaling have many advantages, such as high noise immunity and low noise radiation, yet common-mode noise are becoming higher and higher resulting data rate approaches GHz level. Hence, broadside-coupled differential delay lines are proposed for common-mode noise reduction in this research. Simulation results show that time-domain common-mode noise on broadside-coupled serpentine and spiral delay lines can reduce 79 % and 84.57 % compared with edge-coupled serpentine and spiral delay lines. Similarly, frequency-domain differential to common-mode conversions have significant reduction at the frequency band of interest.
         
        
            Keywords : 
circuit noise; delay lines; electromagnetic compatibility; broadside coupled delay line; broadside coupled differential delay lines; common mode noise reduction; differential signaling; edge coupled differential delay lines; high speed connection; low noise radiation; noise immunity; Crosstalk; Delay lines; Noise; Noise reduction; Routing; Spirals; Time-domain analysis; broadside-coupled differential delay lines; commom-mode noise; differential to common-mode conversions; edge-coupled differential delay lines;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
         
        
            Conference_Location : 
Santa Clara, CA
         
        
            Print_ISBN : 
978-1-4799-1992-5
         
        
        
            DOI : 
10.1109/EMCSI.2015.7107675