Title :
Delay Fault Test Generation with Cellular Aulhomata
Author :
Nandi, S. ; Vamsi, B. ; Chakraborty, S. ; Chaudhuri, P. Pal ; Roy, Samir
Author_Institution :
Indian Institute of Technology
Keywords :
Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Logic testing; System testing; Test pattern generators; Timing;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669697
