Title :
A test set for LEDs life model estimation
Author :
Albertini, Andrea ; Masi, Maria Gabriella ; Mazzanti, Giovanni ; Peretto, Lorenzo ; Tinarelli, Roberto
Author_Institution :
Dept. of Electr. Eng., Univ. of Bologna, Bologna, Italy
Abstract :
Life models relate the time to failure to the applied stress. They can be derived starting from knowledge of chemical/physical phenomena involved in the ageing process caused by the stress or by means of regressive techniques on data acquired in ALT-based procedure. Anyway, experimental tests are needed. This paper deals with a test system implemented to estimate a life model for LEDs where the forward current is considered as stress.
Keywords :
ageing; failure analysis; life testing; light emitting diodes; stress analysis; ALT-based procedure; LED test system; ageing process; chemical-physical phenomena; life model estimation; regressive techniques; stress; Aging; Chemical processes; Cost function; Failure analysis; Life estimation; Life testing; Light emitting diodes; Preventive maintenance; System testing; Thermal stresses; LEDs; MTTF; Reliability; accelerated test; life model;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488033
