• DocumentCode
    2686175
  • Title

    Evaluation of the Safe Failure Fraction for an electromechanical complex system: remarks about the standard IEC61508

  • Author

    Catelani, M. ; Ciani, L. ; Luongo, V. ; Singuaroli, R.

  • Author_Institution
    Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    949
  • Lastpage
    953
  • Abstract
    The paper discusses a case study concerning the evaluation of the Safe Failure Fraction (SFF) for a complex system. Being such evaluation made according to IEC61508 standard, the paper focused on some related ambiguities. The paper is structured in two phases. First, a reliability prediction of each component of the system is implemented and then a Failure Mode and Effect, Diagnostic Analysis (FMEDA) is applied, we selected FMEDA for more information about failure condition of each component (modules or systems) under examination. Using this method it is possible to study SFF of different complex systems in compliance with qualitative requirements described in the standard. The main purposes of this paper are to facilitate the application of the standard and to clarify some of related ambiguities and to propose ways to satisfy the requirements related to how hardware architecture may be configured also referred to the architectural constraints.
  • Keywords
    IEC standards; electrical safety; reliability theory; IEC61508; complex systems; diagnostic analysis; electromechanical complex system; failure mode; hardware architecture; reliability prediction; safe failure fraction; Electrical safety; Failure analysis; Fault tolerance; Hardware; Industrial electronics; Information analysis; Phase frequency detector; Safety devices; Telecommunication standards; Testing; Diagnostic Analysis; Failure Mode and Effect; IEC61508; Reliability prediction; Safe Failure Fraction; Safety Related System;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488034
  • Filename
    5488034