• DocumentCode
    2686224
  • Title

    Computer simulation of crack propagation in power electronics module solder joints

  • Author

    Hua Lu ; Ridout, S. ; Bailey, Christopher ; Wei Sun Loh ; Pearl, A. ; Johnson, Mark

  • Author_Institution
    Sch. of Comput. & Math. Sci., Univ. of Greenwich, London
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A numerical modelling method for the analysis of solder joint damage and crack propagation has been described in this paper. The method is based on the disturbed state concept. Under cyclic thermal-mechanical loading conditions, the level of damage that occurs in solder joints is assumed to be a simple monotonic scalar function of the accumulated equivalent plastic strain. The increase of damage leads to crack initiation and propagation. By tracking the evolution of the damage level in solder joints, crack propagation path and rate can be simulated using Finite Element Analysis method. The discussions are focused on issues in the implementation of the method. The technique of speeding up the simulation and the mesh dependency issues are analysed. As an example of the application of this method, crack propagation in solder joints of power electronics modules under cyclic thermal-mechanical loading conditions has been analyzed and the predicted cracked area size after 3000 loading cycles is consistent with experimental results.
  • Keywords
    finite element analysis; modules; power electronics; soldering; crack propagation; cyclic thermal-mechanical loading conditions; finite element analysis method; numerical modelling method; power electronics module solder joints; Analytical models; Capacitive sensors; Computer simulation; Finite element methods; Lead; Numerical models; Plastics; Power electronics; Soldering; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4606983
  • Filename
    4606983