Title :
Histogram test of ADCs with chaotic samples
Author :
Addabbo, Tommaso ; Fort, Ada ; Rocchi, Santina ; Vignoli, Valerio
Author_Institution :
Inf. Eng. Dept., Univ. of Siena, Siena, Italy
Abstract :
In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.
Keywords :
analogue-digital conversion; chaos; ADC; analog to digital converters; chaotic samples; code density test; discrete-time noise generator; histogram test; Analog-digital conversion; Chaos; Circuit noise; Circuit testing; Histograms; Noise generators; Noise reduction; Probability density function; Process design; Stochastic processes;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488041
