DocumentCode
2686323
Title
Progress in SiGe heterostructure devices
Author
König, U.
Author_Institution
Res. Center, Daimler-Chrysler AG, Ulm, Germany
fYear
1999
fDate
36186
Firstpage
42522
Lastpage
42527
Abstract
Since a few years SiGe/Si heterodevices have entered the semiconductors world. In particular, the SiGe heterobipolar transistor (SiGe HBT) has demonstrated a record fmax value of 160 GHz. The SiGe hetero-field effect transistor (SiGe HFET) is presently catching up in performance with a speed of 120 GHz. This paper reviews device and circuit results. An important issue is the compatibility to the dominating silicon technology which opens perspectives for new generations of high volume and low cost microelectronic components
Keywords
heterojunction bipolar transistors; 120 GHz; 160 GHz; SiGe-Si; SiGe/Si heterostructure device; hetero-field effect transistor; heterobipolar transistor; microelectronic component; semiconductor;
fLanguage
English
Publisher
iet
Conference_Titel
Advances in Semiconductor Devices (Ref. No. 1999/025), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19990154
Filename
755816
Link To Document