Software-related EMI test pattern auto-generation for 2-stage pipeline microcontroller

Time-domain measurement on microcontroller (μC) conducted electromagnetic interference (cEMI) is an essential part for software-related EMI (SW-EMI) modeling. To make a SW-EMI model, several signal process procedures should be done. One of the procedures is the time-domain waveform test pattern generation. Due to the SW-related issues, the test patterns must go through all of test pattern of the target μC machine codes (instructions). However, an efficient algorithm for automatic test pattern generation for SW-EMI is not available. This paper proposes an efficient pattern generation algorithm of the testing programs, which reduces the test pattern number from the permutation of all test patterns to some combination test patterns without reducing the pattern coverage. The generated test pattern size is 50% reduced by the proposed algorithm. This algorithm is dedicated to SW-EMI modeling and is implemented by MATLAB.