DocumentCode
2686651
Title
All digital ADC with linearity correction and temperature compensation
Author
Negreiros, Marcelo ; Carro, Luigi ; Cassel, Gustavo
Author_Institution
Inst. de Inf., UFRGS, Porto Alegre, Brazil
fYear
2010
fDate
3-6 May 2010
Firstpage
147
Lastpage
152
Abstract
While digital circuits benefit from high-density digital CMOS technology, the design of analog and mixed signal blocks in the same technology is a higher challenge at each new technology node. AD converters are an example of such blocks. A possible solution is the implementation of ADCs in digital technology using logic gates as a voltage controlled oscillator. However, the limited linearity and temperature sensitivity are known issues. In this paper, a linearity correction technique that is also able to compensate for temperature effects is used. Results indicate the feasibility of the approach.
Keywords
analogue-digital conversion; compensation; logic gates; voltage-controlled oscillators; all digital ADC; linearity correction; logic gates; signal blocks; temperature compensation; voltage controlled oscillator; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Digital circuits; Linearity; Logic gates; Signal design; Temperature sensors; Voltage-controlled oscillators; VCO-based ADC; temperature compensation;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488059
Filename
5488059
Link To Document