• DocumentCode
    2686651
  • Title

    All digital ADC with linearity correction and temperature compensation

  • Author

    Negreiros, Marcelo ; Carro, Luigi ; Cassel, Gustavo

  • Author_Institution
    Inst. de Inf., UFRGS, Porto Alegre, Brazil
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    147
  • Lastpage
    152
  • Abstract
    While digital circuits benefit from high-density digital CMOS technology, the design of analog and mixed signal blocks in the same technology is a higher challenge at each new technology node. AD converters are an example of such blocks. A possible solution is the implementation of ADCs in digital technology using logic gates as a voltage controlled oscillator. However, the limited linearity and temperature sensitivity are known issues. In this paper, a linearity correction technique that is also able to compensate for temperature effects is used. Results indicate the feasibility of the approach.
  • Keywords
    analogue-digital conversion; compensation; logic gates; voltage-controlled oscillators; all digital ADC; linearity correction; logic gates; signal blocks; temperature compensation; voltage controlled oscillator; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Digital circuits; Linearity; Logic gates; Signal design; Temperature sensors; Voltage-controlled oscillators; VCO-based ADC; temperature compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488059
  • Filename
    5488059