Title :
Attenuators using thin film resistors for RF application
Author :
Sun, Yiqin ; Li, Lei ; Lin, Han ; Yu, Zhiyuan ; Huang, Mian ; Wan, Lixi
Author_Institution :
Shenzhen Inst. of Adv. Technol., Chinese Univ. of Hong Kong, Shenzhen
Abstract :
This paper presents a simple methodology for deducing the resistors of attenuators based on the relationship of S parameters and ABCD metric. Single attenuators composed of embedded thin film resistors simulate up to 20 GHz. For 30 dB attenuators is difficult to implement for wide bandwidth, cascade attenuators can solve the problem.
Keywords :
S-parameters; attenuators; microwave devices; thin film resistors; ABCD metric; S parameters; cascade attenuators; embedded thin film resistors; wide bandwidth; Attenuators; Dielectric substrates; Dielectric thin films; Microelectronics; Optical reflection; Radio frequency; Resistors; Sheet materials; Thin film circuits; Transistors; attenuators; cascade attenators; thin film resistor;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
DOI :
10.1109/ICEPT.2008.4607011
