• DocumentCode
    2686728
  • Title

    A new approach of thermal type microsensor with photonic crystal

  • Author

    Hsu, Po-Hao ; Tsai, Meng-Hung ; Shen, Chih-Hsiung ; Chen, Shu-Jung

  • Author_Institution
    Dept. of Mechatron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    283
  • Lastpage
    286
  • Abstract
    A new idea of improving complementary metal-oxide-semiconductor (CMOS) thermopile performance is introduced to increase the absorption of infrared radiation by leading the photonic crystal (PC) into thermopile in this paper. A highly sensitive infrared detector requires an excellent signal induced by incident IR radiation to maximize the temperature change. A photonic crystal structure offers significantly effect for absorption of infrared radiation. Firstly we develop such a structure of thermopile with high performance by using 0.35μm 2P4M CMOS IC compatible process which can be easily and exactly fabricated. Several designs of infrared microsensors are proposed to study influential parameters from photonic crystal structure. The measurement results show these devices get greatly responses higher than the thermopile without photonic crystal. To that end, an optimal parameter is acquired at the same time. Our design is proved to be adequate for commercial batch production.
  • Keywords
    CMOS integrated circuits; infrared detectors; microsensors; photonic crystals; thermopiles; CMOS IC compatible process; CMOS thermopile; commercial batch production; complementary metal-oxide-semiconductor; incident IR radiation; infrared radiation; photonic crystal; size 0.35 mum; thermal type microsensor; CMOS process; CMOS technology; Electromagnetic wave absorption; Etching; Fabrication; Infrared detectors; Microsensors; Optical propagation; Photonic crystals; Structural beams; CMOS MEMS; infrared radiation; microsensor; photonic crystal; thermopile;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488063
  • Filename
    5488063