DocumentCode :
2686894
Title :
Study on thermal simulation technology for SMA in lead-free reflow soldering
Author :
Zhaohua, Wu ; Dejian, Zhou
Author_Institution :
Sch. of Mech.&Electr. Eng., Guilin Univ. of Electron. Technol., Guilin
fYear :
2008
fDate :
28-31 July 2008
Firstpage :
1
Lastpage :
6
Abstract :
The thermal mathematical model under intensive convection in lead-free reflow soldering process is constructed for surface mounted assemblies, and the heat conduction governing equation, initial condition and boundary condition are made. A thermal mathematical model of SMA is transformed into solid model which can be analyzed by the thermal analysis software FLOTHERM. Then by defining the reasonable boundary condition and model simulating analysis, the thermograph contour map and profile for the SMA are obtained. Using the data relevant to simulation reflow profile and orthogonal experiment design to set up the factor effect table, the degree of the critical parameters of lead-free reflow soldering process affecting the key index of thermal profile would be obtained. The results show that the heating rate is mainly affected by the conveyer belt speed, temperature of heating zone No.6 and No.2; the maximum temperature is mainly affected by the conveyer belt speed, temperature of heating zone No.6 and No.7; and the soldering time of extension melting point temperature is mostly affected by conveyer belt speed.
Keywords :
heat conduction; reflow soldering; surface mount technology; thermal analysis; thermal management (packaging); FLOTHERM; conveyer belt speed; heat conduction; lead-free reflow soldering; surface mounted assemblies; thermal analysis software; thermal mathematical model; thermal simulation; thermograph contour map; Belts; Boundary conditions; Environmentally friendly manufacturing techniques; Heating; Lead; Mathematical model; Reflow soldering; Semiconductor device modeling; Temperature; Thermal conductivity; Lead-free Reflow Soldering; Orthogonal Experiment Design; Surface Mounted Assembly; Thermal Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
Type :
conf
DOI :
10.1109/ICEPT.2008.4607025
Filename :
4607025
Link To Document :
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