• DocumentCode
    2686928
  • Title

    Ion temperature in an electron cyclotron resonance plasma as determined by laser induced fluorescence Doppler width measurements

  • Author

    Den Hartog, E.A. ; Persing, H. ; Woods, R.C.

  • fYear
    1990
  • fDate
    21-23 May 1990
  • Firstpage
    210
  • Lastpage
    211
  • Abstract
    Summary form only given. The transverse ion temperature in an electron cyclotron resonance (ECR) plasma was determined by measuring the Doppler-broadened line shape of a suitable N+2 transition using laser-induced fluorescence (LIF) techniques. LIF is a noninvasive means of measuring the transverse ion temperature, which offers good spatial resolution, as opposed to a line-integrated emission measurement. The perpendicular ion temperature in this nitrogen plasma was measured on axis 30 cm downstream from the ECR region. Over a range of neutral pressures (0.5 mtorr⩽P⩽4mtorr,), the transverse ion temperature was found to vary from 0.35 eV to 0.15 eV. Although the parallel ion energy has not been measured in this device, it is expected to be comparable to the decrease in plasma potential measured between the ECR source and downstream regions
  • Keywords
    Doppler effect; fluorescence; plasma diagnostics; plasma temperature; 0.35 to 0.15 eV; 0.5 to 4 mtorr; Doppler-broadened line shape; ECR source; N plasma; N2+; electron cyclotron resonance plasma; laser induced fluorescence Doppler width measurements; neutral pressures; perpendicular ion temperature; plasma potential; spatial resolution; transverse ion temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1990. IEEE Conference Record - Abstracts., 1990 IEEE International Conference on
  • Conference_Location
    Oakland, CA, USA
  • Type

    conf

  • DOI
    10.1109/PLASMA.1990.110846
  • Filename
    5726116