DocumentCode
2687052
Title
Key aspects on ESD protection design for ICs: mixed-mode simulation and RF/mixed-signal ESD
Author
Wang, Aiping ; Feng, Hua ; Chen, Gang ; Zhan, Ronghui ; Xie, Huan ; Wu, Qingyao ; Guan, Xiangyu
Author_Institution
Dept. of ECE, Illinois Inst. of Technol., Chicago, IL, USA
Volume
2
fYear
2003
fDate
21-24 Oct. 2003
Firstpage
1000
Abstract
This paper reviews the key aspects in on-chip ESD (electrostatic discharge) protection circuitry design. The mixed-mode ESD simulation-design methodology is discussed to address the design prediction task. New challenges in ESD protection design for RF/mixed-signal ICs are discussed that include the complex ESD-circuit interactions. RF ESD protection characterization and full-chip ESD protection solutions.
Keywords
circuit simulation; electrostatic discharge; integrated circuit design; mixed analogue-digital integrated circuits; protection; radiofrequency integrated circuits; ESD protection circuitry design; ESD protection design; RF ESD; RF IC; complex ESD-circuit interactions; electrostatic discharge; mixed-mode ESD simulation; mixed-signal ESD; mixed-signal IC; on-chip ESD;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2003. Proceedings. 5th International Conference on
ISSN
1523-553X
Print_ISBN
0-7803-7889-X
Type
conf
DOI
10.1109/ICASIC.2003.1277380
Filename
1277380
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