• DocumentCode
    2687061
  • Title

    Analytical analysis on the effect of time duration of acceleration pulse to a JEDEC board in drop test

  • Author

    Zhou, Jiang

  • Author_Institution
    Dept. of Mech. Eng., Lamar Univ., Beaumont, TX
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The objective of this paper is to simulate a JEDEC test board dynamic response with the use of a simplified analytical model. A block-diagram based Matlab/Simulink model was also built to perform the parametric study. It is found that the desirable predominated mode and no-ringing dynamic response can not be achieved for the test board and input profile with current JEDEC standard. Time durations of the input acceleration plays an important role in the dynamic response. The system response can be designed by carefully choosing the acceleration time duration. It is very meaningful in the design of board level drop test in the electronic industries. With the time duration adjusting to 1.5 times of the system period for the standard JEDEC test board, no-ringing response occurs. A closed-form theoretical solution was obtained for half-sine acceleration pulse input. The analytical simulation was confirmed by the theoretical results.
  • Keywords
    printed circuit testing; JEDEC board; Matlab; Simulink; acceleration pulse; closed-form theoretical solution; drop test; electronic industries; Acceleration; Analytical models; Electronic equipment testing; Electronics industry; Electronics packaging; Life estimation; Mathematical model; Modal analysis; Parametric study; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607035
  • Filename
    4607035