DocumentCode
2687129
Title
The reduction of electromagnetic interference in RF integrated circuits through the use of metalized substrates
Author
Yang, H. Y David ; Zhou, Cheng-Zhi
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Chicago, IL
fYear
2006
fDate
9-14 July 2006
Firstpage
65
Lastpage
68
Abstract
This paper discussed the use of metalized substrates for coupling (EMI) reduction of integrated circuit components. Coupled microstrip lines with arrays of shorting vias or mushrooms were used for demonstration. It was found that the metalized substrate could reduce the circuit coupling at lower frequencies due to the shielding effect and enhance the coupling at much higher frequencies due to the scattering and radiation of the metalized substrate. It was also found that the use of metalized EBG elements over the entire substrate, although eliminating the surface wave, would enhance the circuit coupling by introducing additional capacitance between strips at higher frequencies. At lower frequencies, the inductive vias are effectively shorted to the ground and provide shielding to reduce circuit coupling
Keywords
electromagnetic interference; electromagnetic shielding; microstrip lines; radiofrequency integrated circuits; RF integrated circuit components; circuit coupling; coupled microstrip lines; coupling reduction; electromagnetic interference reduction; electromagnetic shielding; metalized EBG elements; metalized substrates; surface wave; Coupling circuits; Dielectric substrates; Distributed parameter circuits; Electromagnetic interference; Microstrip antenna arrays; Photonic band gap; Radio frequency; Radiofrequency integrated circuits; Strips; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
1-4244-0123-2
Type
conf
DOI
10.1109/APS.2006.1710453
Filename
1710453
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