• DocumentCode
    2687325
  • Title

    GaN HEMT with scalable >2.2 kV breakdown voltage

  • Author

    Alpern, Yair ; Baksht, Tamara ; Bunin, Gregory ; Capua, Eyal ; Roiter, Yulia ; Rozman, David

  • Author_Institution
    VisIC Technol., Israel
  • fYear
    2011
  • fDate
    7-9 Nov. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    AlGaN/GaN High Electron Mobility Transistors (HEMTs) are well recognized today as the best electron devices for power amplification in microwave frequency range for power transmitters and RADARs. GaN-based devices promise to have the best power performance not only in signal amplification area but also in huge area of power conversion. This paper describes what unique properties of GaN enable handling of high power levels at high frequencies, how GaN-based transistors empower new generation of power electronics and few key technologies and operation principles of GaN transistors for microwave and power electronics. The measurement results of AlGaN/GaN HEMTs without field plates with breakdown voltage higher than 2 kV are presented.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; microwave field effect transistors; wide band gap semiconductors; AlGaN-GaN; HEMT; electron devices; high electron mobility transistors; power amplification; power conversion; power electronic generation; power transmitters; radar; scalable breakdown voltage; signal amplification area; Aluminum gallium nitride; Electric breakdown; Gallium nitride; HEMTs; Logic gates; Semiconductor device measurement; AlGaN/GaN HEMT; breakdown; power conversion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
  • Conference_Location
    Tel Aviv
  • Print_ISBN
    978-1-4577-1692-8
  • Type

    conf

  • DOI
    10.1109/COMCAS.2011.6105935
  • Filename
    6105935