DocumentCode
2687325
Title
GaN HEMT with scalable >2.2 kV breakdown voltage
Author
Alpern, Yair ; Baksht, Tamara ; Bunin, Gregory ; Capua, Eyal ; Roiter, Yulia ; Rozman, David
Author_Institution
VisIC Technol., Israel
fYear
2011
fDate
7-9 Nov. 2011
Firstpage
1
Lastpage
3
Abstract
AlGaN/GaN High Electron Mobility Transistors (HEMTs) are well recognized today as the best electron devices for power amplification in microwave frequency range for power transmitters and RADARs. GaN-based devices promise to have the best power performance not only in signal amplification area but also in huge area of power conversion. This paper describes what unique properties of GaN enable handling of high power levels at high frequencies, how GaN-based transistors empower new generation of power electronics and few key technologies and operation principles of GaN transistors for microwave and power electronics. The measurement results of AlGaN/GaN HEMTs without field plates with breakdown voltage higher than 2 kV are presented.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; microwave field effect transistors; wide band gap semiconductors; AlGaN-GaN; HEMT; electron devices; high electron mobility transistors; power amplification; power conversion; power electronic generation; power transmitters; radar; scalable breakdown voltage; signal amplification area; Aluminum gallium nitride; Electric breakdown; Gallium nitride; HEMTs; Logic gates; Semiconductor device measurement; AlGaN/GaN HEMT; breakdown; power conversion;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location
Tel Aviv
Print_ISBN
978-1-4577-1692-8
Type
conf
DOI
10.1109/COMCAS.2011.6105935
Filename
6105935
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