DocumentCode :
2687463
Title :
Fundamental influence of segregated Bi on the mechanical properties of interconnect of bismuth-containing solder and copper
Author :
Pang, Xue-Yong ; Liu, Zhi-Quan ; Wang, Shao-Qing ; Shang, Jian-Ku
Author_Institution :
Shenyang Nat. Lab. for Mater. Sci., Chinese Acad. of Sci., Shenyang
fYear :
2008
fDate :
28-31 July 2008
Firstpage :
1
Lastpage :
3
Abstract :
We employed density functional theory to investigate bismuth segregation at Cu/Cu3Sn interface. Firstly, we considered five initial constructions by adopting the adhesion energies criterion. By comparing adhesion energies of them, the so-called ldquoBetween-Curdquo construction was found to be the most energy-favored (0.98J/m2). Secondly, based on ldquoBetween-Curdquo construction, we introduced eight possible segregation sites. Among these eight sites, Site-2 was determined to be the most likely segregation site with adhesion energy as low as 0.53J/m2, which is almost half of the adhesion energy of the initial construction. Finally, we analyzed atomic structure and electronic density, from which it was found that the interfacial space was enlarged by bismuth segregation and the bond between the first layer and the second layer at copper side was weakened. Our calculated result is qualitatively consistent with reported experimental results and can explain them well.
Keywords :
adhesion; copper; density functional theory; electron density; integrated circuit interconnections; segregation; solders; Cu-Cu3Sn; adhesion energies criterion; adhesion energy; atomic structure; bismuth-containing solder; copper; density functional theory; electronic density; interconnect; mechanical properties; segregation; segregation sites; Adhesives; Aging; Atomic layer deposition; Bismuth; Bonding; Copper alloys; Intermetallic; Lead; Materials science and technology; Mechanical factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
Type :
conf
DOI :
10.1109/ICEPT.2008.4607064
Filename :
4607064
Link To Document :
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