• DocumentCode
    2687465
  • Title

    Process characterization for a surface mount rework system

  • Author

    Spigarelli, Donald J. ; Hyman, Harold

  • Author_Institution
    SRT, Westford, MA, USA
  • fYear
    1990
  • fDate
    0-0 1990
  • Firstpage
    353
  • Lastpage
    367
  • Abstract
    A method is presented by which thermal characterization of a surface-mount rework system was achieved. The method includes identification of process variables and their classification as operator, setup, or use variables. Using a thermocoupled board, a data logger recorded the temperatures of the lead of a PLCC-52 and two adjacent sites, 0.075 in and 0.150 in from the solder joint. The test method chosen used a constant PLCC-52 solder joint temperature and measured the time required to meet the temperature with variables changed, incrementally, one at a time. For this system it was found that the bottom heater temperature had little effect on solder joint time to temperature, and that the system was relatively sensitive to vertical heater position and insensitive to lateral heater position within the range tested. The testing exposed the inadequacy of depending on hand attachment of thermocouples to circuits to study their dynamic thermal behavior.<>
  • Keywords
    printed circuit manufacture; surface mount technology; PLCC-52; bottom heater temperature; classification; data logger; dynamic thermal behavior; identification of process variables; inadequacy of hand attachment of thermocouples; insensitive to lateral heater position; operator; process characterisation; process window; sensitive to vertical heater position; setup; solder joint temperature; solder joint time; surface mount rework system; thermal characterization; thermocoupled board; use variables; Assembly; Circuits; Control systems; Cooling; Instruments; Production systems; Sensitivity analysis; Surface-mount technology; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990, IEMT Conference., 8th IEEE/CHMT International
  • Conference_Location
    Baveno, Italy
  • Type

    conf

  • DOI
    10.1109/IEMT8.1990.171047
  • Filename
    171047