DocumentCode
2687479
Title
Effects of Bi and Ni addition on wettability and melting point of Sn-0.3Ag-0.7Cu Low-Ag Pb-free solder
Author
Liu, Y. ; Sun, F.L. ; Yan, T.L. ; Hu, W.G.
Author_Institution
Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Dongli
fYear
2008
fDate
28-31 July 2008
Firstpage
1
Lastpage
4
Abstract
Bi and Ni were added to Sn-0.3Ag-0.7Cu low-Ag solder, to fabricate new low-Ag solders, Sn-0.3Ag-0.7Cu-XBi (X= 1.0, 3.0, 4.5) and Sn-0.3Ag-0.7Cu-XNi (X=0.05, 0.10, 0.15). Melting point tests were carried out with DSC (differential scanning calorimetry) instrument. Wettability tests were conducted on a wetting balance instrument. Test results of the two new solders were compared with that of Sn-0.3Ag-0.7Cu respectively to study the effects of the adding elements on the melting point and wettability of the low-Ag Pb-free solder. It shows that Bi addition has striking positive effects on decreasing the melting point and improving wettability. Ni addition could improve the wettability as well, although not as much as Bi does. And Ni has a negative effect on melting point. With proper adding amount as X=3.0, Bi could significantly improve the wettability and decrease melting point at the same time. However, too much Bi addition could increase the melting range between liquidus and solidus, which may lead to the initiation of solidification crack of the solder joints.
Keywords
association; bismuth; differential scanning calorimetry; melting point; nickel; silver; solders; solidification; tin alloys; wetting; Bi addition; DSC instrument; Ni addition; Pb-free solder; Sn-0.3Ag-0.7Cu low-Ag solder; SnAgCuBi; SnAgCuNi; differential scanning calorimetry instrument; melting point; solder joints; solidification crack; wettability tests; wetting balance instrument; Bismuth; Calorimetry; Chemical technology; Instruments; Lead; Materials science and technology; Soldering; Surface-mount technology; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2739-0
Electronic_ISBN
978-1-4244-2740-6
Type
conf
DOI
10.1109/ICEPT.2008.4607065
Filename
4607065
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