• DocumentCode
    2687479
  • Title

    Effects of Bi and Ni addition on wettability and melting point of Sn-0.3Ag-0.7Cu Low-Ag Pb-free solder

  • Author

    Liu, Y. ; Sun, F.L. ; Yan, T.L. ; Hu, W.G.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Dongli
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Bi and Ni were added to Sn-0.3Ag-0.7Cu low-Ag solder, to fabricate new low-Ag solders, Sn-0.3Ag-0.7Cu-XBi (X= 1.0, 3.0, 4.5) and Sn-0.3Ag-0.7Cu-XNi (X=0.05, 0.10, 0.15). Melting point tests were carried out with DSC (differential scanning calorimetry) instrument. Wettability tests were conducted on a wetting balance instrument. Test results of the two new solders were compared with that of Sn-0.3Ag-0.7Cu respectively to study the effects of the adding elements on the melting point and wettability of the low-Ag Pb-free solder. It shows that Bi addition has striking positive effects on decreasing the melting point and improving wettability. Ni addition could improve the wettability as well, although not as much as Bi does. And Ni has a negative effect on melting point. With proper adding amount as X=3.0, Bi could significantly improve the wettability and decrease melting point at the same time. However, too much Bi addition could increase the melting range between liquidus and solidus, which may lead to the initiation of solidification crack of the solder joints.
  • Keywords
    association; bismuth; differential scanning calorimetry; melting point; nickel; silver; solders; solidification; tin alloys; wetting; Bi addition; DSC instrument; Ni addition; Pb-free solder; Sn-0.3Ag-0.7Cu low-Ag solder; SnAgCuBi; SnAgCuNi; differential scanning calorimetry instrument; melting point; solder joints; solidification crack; wettability tests; wetting balance instrument; Bismuth; Calorimetry; Chemical technology; Instruments; Lead; Materials science and technology; Soldering; Surface-mount technology; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607065
  • Filename
    4607065