DocumentCode

268768

Title

IEEE International Integrated Reliability Workshop (IIRW)

Volume

13

Issue

3

fYear

2013

fDate

Sept. 2013

Firstpage

423

Lastpage

423

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2013.2279328

Filename

6588395