• DocumentCode
    2687694
  • Title

    Compact instrumentation for radiation tolerance test of flash memories in space environment

  • Author

    Pace, Calogero ; Della Sala, Ernesto ; Capuano, Giuseppe ; Libertino, Sebania ; Crupi, Isodiana ; Marino, Antonio ; Lombardo, Salvatore ; Lisiansky, Michael ; Roizin, Yakov

  • Author_Institution
    Dept. of Electron., Comput. Sci. & Syst., Univ. of Calabria, Rende, Italy
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    652
  • Lastpage
    655
  • Abstract
    Aim of this work is the description of a test equipment, designed to be integrated on board of a microsatellite, able to investigate the radiation tolerance of non-volatile memory arrays in a real flight experiment. An FPGA-based design was adopted to preserve a high flexibility degree. Besides standard Program/Read/Erase functions, additional features such as failure data screening and latch-up protection have been implemented. The instrument development phase generated, as a by-product, a non-rad-hard version of the instrument that allowed performing in-situ experiments using 60Co and 10 MeV Boron irradiation facilities on Ground. Preliminary measurement results are reported to show the instrumentation potential.
  • Keywords
    flash memories; radiation hardening (electronics); random-access storage; tolerance analysis; FPGA-based design; compact instrumentation; failure data screening; flash memories; latch-up protection; nonvolatile memory arrays; radiation tolerance test; space environment; Electronic components; Electronic equipment testing; Flash memory; Instruments; Nonvolatile memory; Performance evaluation; Poles and towers; Satellites; System testing; Test equipment; FPGA-based instrumentation; non-volatile memory; radiation hardness; space equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488118
  • Filename
    5488118