DocumentCode :
2687759
Title :
Testing for reliability-relevant or misleading?
Author :
Hunter, John
Author_Institution :
Adv. Assembly Technol., Adv. Micro Devices Inc., Sunnyvale, CA, USA
fYear :
1998
fDate :
8-10 Dec 1998
Firstpage :
10
Lastpage :
11
Abstract :
Summary form only given. The semiconductor content of electronic systems has increased strongly in the last three decades. It is expected that the performance and functionality of these semiconductors will continue to increase, according to some version of Moore´s Law, while costs (as measured per gate or per bit) will continue to fall. What has also become expected, although it is not often stated explicitly, is that electronics reliability must continue to improve. Manufacturers of electronic systems will have to provide this improved reliability or risk losing their customers to competition; and given the rapidly increasing semiconductor content in these systems, it is natural to anticipate that the semiconductor suppliers should be playing a significant role in this endeavour. This article discusses what this role should be, and how it should be defined
Keywords :
integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; Moore´s Law; electronic system manufacturers; electronic systems; electronics reliability; functionality; market competition; reliability; reliability testing; semiconductor content; semiconductor costs; semiconductor performance; semiconductor suppliers; Assembly; Consumer electronics; Failure analysis; Inorganic materials; Materials reliability; Organic materials; Packaging; Semiconductor device manufacture; Semiconductor device reliability; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
Type :
conf
DOI :
10.1109/EPTC.1998.755970
Filename :
755970
Link To Document :
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