• DocumentCode
    2687980
  • Title

    Bit-precision and performance analysis of dynamic kernel function fast fourier transform

  • Author

    Lee, Yu-Heng George ; Chen, Chien-In Henry

  • Author_Institution
    Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    187
  • Lastpage
    191
  • Abstract
    The proposed dynamic kernel function uses an efficient fixed-point numerical representation of the twiddle factor (i.e., complex roots of unity) and replaces the cumbersome multipliers in FFT with simple shift-and-add operations to enhance the data throughput rate for high-speed wideband signal detection. Numerical representation in hardware plays a role in determining the dynamic range and bit precision of FFT processors. The proposed variable truncation scheme dynamically scales the computation data and maximizes the use of fixed-input and inter-stage wordlength in a fixed-point FFT. The dynamic data scaling algorithm enhances the dynamic range of fixed-point fixed-precision FFT designs and emulates the precision benefits of floating-point representation without complicated design additions. The development of dynamic kernel function FFT performance models using different variations of inter-stage bit precision shows a relative trade-off between precision bits to FFT SFDR.
  • Keywords
    fast Fourier transforms; signal detection; FFT; bit-precision analysis; cumbersome multipliers; dynamic kernel function fast Fourier transform; fixed-point numerical representation; floating-point representation; inter-stage bit precision; interstage wordlength; shift-and-add operations; twiddle factor; Algorithm design and analysis; Dynamic range; Fast Fourier transforms; Hardware; Heuristic algorithms; Kernel; Performance analysis; Signal detection; Throughput; Wideband; Fast Fourier transform (FFT); dynamic kernel function FFT; spurious-free dynamic range (SFDR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488132
  • Filename
    5488132