Title :
The Ultra CSPTM wafer scale package
Author_Institution :
Flip Chip Technol., Phoenix, AZ, USA
Abstract :
There has been a significant amount of work over the past 5 years on chip scale packaging. The majority of this work has been an extension of conventional IC packaging technology utilizing either wire bonders and/or TAB type packaging technology. Handling discrete devices during the IC packaging for these type of CSPs has resulted in a relatively high cost for these packages and lower IC package yields than desired. This paper presents a new wafer scale packaging technology called the Ultra CSP. Advantages of this wafer scale packaging concept includes commonality with standard IC processing technology for the majority of the packaging process. This paper covers in detail the reliability results achieved for the Ultra CSP on a variety of package sizes and I/O counts covering the range typically seen in microcontrollers, flash and new DRAM architectures. There is also significant discussion on optimization work done on board pad size, solder paste volume and solder paste type
Keywords :
DRAM chips; chip scale packaging; flash memories; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; materials handling; microassembling; microcontrollers; soldering; CSPs; DRAM architectures; IC package yields; IC packaging; IC packaging technology; TAB type packaging technology; Ultra CSP; Ultra CSP wafer scale package; board pad size; chip scale packaging; discrete device handling; flash memories; microcontrollers; optimization; package I/O counts; package cost; package size; packaging process; reliability; solder paste type; solder paste volume; standard IC processing technology; wafer scale packaging technology; wire bonders; Chip scale packaging; Costs; Fabrication; Flip chip; Integrated circuit packaging; Packaging machines; Routing; Semiconductor films; Space technology; Wafer scale integration;
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
DOI :
10.1109/EPTC.1998.755983