Title :
Electrochemical corrosion behaviors of ITO films at anodic and cathodic polarization in sodium hydroxide solution
Author :
Hao, Wang ; Cheng, Zhong ; Jin, Li ; Yiming, Jiang
Author_Institution :
Dept. of Mater. Sci., Fudan Univ., Shanghai
Abstract :
The electrochemical corrosion behaviors of indium tin oxides (ITO) films were investigated by electrochemical methods in sodium hydroxide solutions. Cyclic voltammetries of ITO films at both anodic and cathodic polarization were carried out. Transmittance spectra, scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis were used for characterization of the optical transmittance, the corrosion morphology and identification of corrosion product. ITO film remained stable after anodic polarization. In contrast, serious corrosion occurred at cathodic polarization (approximately -1.3 V vs. saturated calomel electrode (SCE)). Meanwhile, optical transmittance decreased greatly. The results showed that some of Sn4+ in the ITO is reduced to the lower metal state in the form of hydroxides of Sn, which attached to the surface.
Keywords :
X-ray diffraction; anodes; cathodes; corrosion; corrosion testing; electrochemical electrodes; indium compounds; polarisation; reduction (chemical); scanning electron microscopy; semiconductor thin films; sodium compounds; voltammetry (chemical analysis); ITO; NaOH; SEM; X-ray diffraction analysis; XRD analysis; anodic polarization; cathodic polarization; corrosion morphology; cyclic voltammetries; electrochemical corrosion behaviors; electrochemical methods; indium tin oxides films; optical transmittance; optical transmittance characterization; saturated calomel electrode; scanning electron microscopy; sodium hydroxide solution; transmittance spectra; Corrosion; Electron optics; Indium tin oxide; Optical diffraction; Optical films; Optical microscopy; Optical polarization; Optical saturation; Scanning electron microscopy; X-ray diffraction;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
DOI :
10.1109/ICEPT.2008.4607097