Title : 
A digitally temperature compensated compact PLL module
         
        
            Author : 
Kobayashi, Toshiaki ; Iwamoto, Hiroyuki ; Hara, Takaaki
         
        
            Author_Institution : 
NEC Corp., Kawasaki, Japan
         
        
        
        
        
        
            Abstract : 
This paper describes our new compact Phase-Locked Loop (PLL) module with high free-running frequency accuracy over a wide temperature range. In order to improve the temperature characteristics of the conventional PLL circuit, a digital temperature compensation circuit has been newly added to it. In addition, this compensation circuit has been installed in our new custom PLL-LSI, as contributes to the down-sizing of the module. Important features for the PLL module with the LSI and a 16.384 MHz fundamental AT-cut crystal unit are high free-running frequency accuracy (with changing temperature: ±0.5 ppm from -40°C to +85°C, and with changing supply voltage: ±0.2 ppm at +3.3 V± 5%), small size (20 mm×20 mm×8.5 mm), low power consumption (43 mW), and low supply voltage operation (+3.3 V). This module generates a 2.048 MHz clock synchronized to an input clock frequency of 8 kHz
         
        
            Keywords : 
automatic frequency control; compensation; crystal resonators; large scale integration; modules; phase locked loops; synchronisation; temperature; -40 to 85 C; 16.384 MHz; 2.048 MHz; 3.3 V; 43 mW; 8 kHz; compact PLL module; custom PLL-LSI; digital temperature compensation circuit; fundamental AT-cut crystal unit; high free-running frequency accuracy; low power consumption; low supply voltage operation; temperature characteristics; temperature compensated PLL; wide temperature range; Adders; Circuits; Energy consumption; Filters; Frequency synchronization; Large scale integration; Low voltage; Phase locked loops; Temperature distribution; Voltage-controlled oscillators;
         
        
        
        
            Conference_Titel : 
Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
         
        
            Conference_Location : 
Orlando, FL
         
        
            Print_ISBN : 
0-7803-3728-X
         
        
        
            DOI : 
10.1109/FREQ.1997.639218